6 results
Identification of the Microscopic Structure of New Hot Carrier Damage Centers in Short Channel Mosfets
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 181
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- 1997
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Comparing the Structure and Behavior of Point Defects in Silicon Oxynitride Gate Dielectrics formed by NH3-Nitridation and N2O-Growth/Nitridation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 31
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- 1994
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Sol-Gel Thin Film Electronic Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 180 / 1990
- Published online by Cambridge University Press:
- 28 February 2011, 413
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- 1990
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Electron Spin Resonance Studies of Silicon Dioxide Films on Silicon in Integrated Circuits Using Spin Dependent Recombination
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- Journal:
- MRS Online Proceedings Library Archive / Volume 159 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 191
- Print publication:
- 1989
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Electrical Properties of Metal-Oxide-Silicon Structures Wrm Sol-Gel Oxides
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- Journal:
- MRS Online Proceedings Library Archive / Volume 121 / 1988
- Published online by Cambridge University Press:
- 25 February 2011, 803
- Print publication:
- 1988
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Dangling Bonds and Sub-Gap Optical Absorption in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 46 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 539
- Print publication:
- 1985
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